После удаления всех разделов и создания одного раздела fat32 я получил эту ошибку в терминале, а затем запустил GSmartControl и получил отчет.
а также chkdsk дал мне ошибку An error occurred while reading file allocation table (FAT 1) .
Теперь я хочу знать, можно ли восстановить жесткий диск или нет?
и отчет GSmartControl:
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.7.6-200.fc24.x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar
Device Model: WDC WD800BB-22JHC0
Serial Number: WD-WMAM9ACC8047
Firmware Version: 05.01C05
User Capacity: 80,025,280,000 bytes [80.0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 (minor revision not indicated)
Local Time is: Thu Dec 29 12:36:04 2016 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 2460) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 35) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 198 198 051 Pre-fail Always - 11183
3 Spin_Up_Time 0x0003 173 158 021 Pre-fail Always - 2333
4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 3233
5 Reallocated_Sector_Ct 0x0033 117 117 140 Pre-fail Always FAILING_NOW 661
7 Seek_Error_Rate 0x000f 172 098 051 Pre-fail Always - 3538
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2381
10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 100 100 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 3096
194 Temperature_Celsius 0x0022 110 084 000 Old_age Always - 33
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 1338
197 Current_Pending_Sector 0x0012 200 180 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 181 181 000 Old_age Offline - 256
199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 12
200 Multi_Zone_Error_Rate 0x0009 076 076 051 Pre-fail Offline - 3972
SMART Error Log Version: 1
ATA Error Count: 14426 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14426 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 10 03 00 00 58 00:24:23.460 READ DMA
c8 00 01 10 03 00 00 58 00:24:21.480 READ DMA
c8 00 01 10 03 00 00 58 00:24:19.365 READ DMA
c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA
c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA
Error 14425 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 10 03 00 00 58 00:24:21.480 READ DMA
c8 00 01 10 03 00 00 58 00:24:19.365 READ DMA
c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA
c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA
c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA
Error 14424 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 10 03 00 00 58 00:24:19.365 READ DMA
c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA
c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA
c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA
c8 00 07 09 03 00 00 58 00:24:13.015 READ DMA
Error 14423 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 10 03 00 00 58 00:24:17.095 READ DMA
c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA
c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA
c8 00 07 09 03 00 00 58 00:24:13.015 READ DMA
c8 00 01 08 03 00 00 58 00:24:13.015 READ DMA
Error 14422 occurred at disk power-on lifetime: 2381 hours (99 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 10 03 00 e0 Error: UNC 1 sectors at LBA = 0x00000310 = 784
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 10 03 00 00 58 00:24:14.980 READ DMA
c8 00 01 10 03 00 00 58 00:24:13.015 READ DMA
c8 00 07 09 03 00 00 58 00:24:13.015 READ DMA
c8 00 01 08 03 00 00 58 00:24:13.015 READ DMA
ec 00 01 00 00 00 00 58 00:24:13.015 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.